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About this Engineering article
Disparity pattern-based autostereoscopic 3D metrology system for in situ measurement of microstructured surfaces by Li, Da; Cheung, Chi Fai; Ren, MingJun; Whitehouse, David; Zhao, Xing is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Li, Da; Cheung, Chi Fai; Ren, MingJun; Whitehouse, David; Zhao, Xing
- Publisher
- Optical Society of America; The Optical Society (ISSN 0146-9592)
- Published
- 2015
- Language
- EN
- Field
- Engineering (Physical Sciences)
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