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Effect of Strike Deposition on Nanoscale Voiding in Electrolytic Ni∕Au by Yu, Yeonseop; Kim, Jinseok; Lim, DoKyung; Lee, SeongJae; Kim, MiYang; Lee, SangWon; Yoo, JongSoo is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Yu, Yeonseop; Kim, Jinseok; Lim, DoKyung; Lee, SeongJae; Kim, MiYang; Lee, SangWon; Yoo, JongSoo
Publisher
The Electrochemical Society; Electrochemical Society, Inc. (ISSN 0013-4651)
Published
2010
Field
Engineering (Physical Sciences)