About this scholarly article

SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Crystals, Multilayers, and Other Synchrotron Optics - Spatially resolved tilt and strain measurements in diamond crystals by Krasnicki, Szczesny B.; Ishikawa, Tetsuya; Macrander, Albert T.; Zhong, Yuncheng; Maj, Jozef; Wood, James L.; Macrander, Albert T. is a scholarly article available to read on EtoBox.

Author

Krasnicki, Szczesny B.; Ishikawa, Tetsuya; Macrander, Albert T.; Zhong, Yuncheng; Maj, Jozef; Wood, James L.; Macrander, Albert T.

Publisher

SPIE

Published

2003

Language

EN