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About this Engineering article
Design and quality assurance of microwave bipolar transistors for high-reliability applications : Toshiaki Irie, Hajime Suzuki and Isamu Nagasako. NEC Res. A Develop., Japan No. 40, p. 1 (Jan. 1976) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 1976
- Language
- EN
- Field
- Engineering (Physical Sciences)