About this scholarly article

2017 IEEE International Electron Devices Meeting (IEDM) - Reliable 50Gb/s silicon photonics platform for next-generation data center optical interconnects by Absil, P.; Croes, K.; Lesniewska, A.; De Heyn, P.; Ban, Y.; Snyder, B.; De Coster, J.; Fodor, F.; Simons, V.; Balakrishnan, S.; Lepage, G.; Golshani, N.; Lardenois, S.; Srinivasan, S. A.; Chen, H.; Vanherle, W.; Loo, R.; Boufadil, R.; Detalle, M.; Miller, A.; Verheyen, P.; Pantouvaki, M.; Van Campenhout, J. is a scholarly article available to read on EtoBox.

Author

Absil, P.; Croes, K.; Lesniewska, A.; De Heyn, P.; Ban, Y.; Snyder, B.; De Coster, J.; Fodor, F.; Simons, V.; Balakrishnan, S.; Lepage, G.; Golshani, N.; Lardenois, S.; Srinivasan, S. A.; Chen, H.; Vanherle, W.; Loo, R.; Boufadil, R.; Detalle, M.; Miller, A.; Verheyen, P.; Pantouvaki, M.; Van Campenhout, J.

Publisher

IEEE

Published

2017

Language

EN