About this scholarly article

SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology 2015 - Beijing, China (Sunday 17 May 2015)] 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - A miniaturized and integrated system to measure key parameters of ophthamic optical coherence tomography equipment by Zhu, Jigui; Tam, Hwa-Yaw; Xu, Kexin; Xiao, Hai; Han, Sen; Fu, Xiaoyu; Hu, Zhixiong; Ge, Chunfeng; Hao, Bingtao; Liu, Wenli; Hong, Baoyu; Jia, Dongfang is a scholarly article available to read on EtoBox.

Author

Zhu, Jigui; Tam, Hwa-Yaw; Xu, Kexin; Xiao, Hai; Han, Sen; Fu, Xiaoyu; Hu, Zhixiong; Ge, Chunfeng; Hao, Bingtao; Liu, Wenli; Hong, Baoyu; Jia, Dongfang

Publisher

SPIE

Published

2015

Language

EN