About this scholarly article

2016 IEEE International Test Conference (ITC) - A built-in self-repair scheme for DRAMs with spare rows, columns, and bits by Hou, Chih-Sheng; Chen, Yong-Xiao; Li, Jin-Fu; Lo, Chih-Yen; Kwai, Ding-Ming; Chou, Yung-Fa is a scholarly article available to read on EtoBox.

Author

Hou, Chih-Sheng; Chen, Yong-Xiao; Li, Jin-Fu; Lo, Chih-Yen; Kwai, Ding-Ming; Chou, Yung-Fa

Publisher

IEEE

Published

2016

Language

EN