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About this Engineering article
Development of Indium-Tin Oxide Diffusion Barrier for Attaining High Reliability of Skutterudite Modules by Kim, Yeongseon; Lee, Ho Seong; Yoon, Giwan; Park, Sang Hyun is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kim, Yeongseon; Lee, Ho Seong; Yoon, Giwan; Park, Sang Hyun
- Publisher
- American Chemical Society; American Chemical Society (ACS) (ISSN 2574-0962)
- Published
- 2020
- Language
- EN
- Field
- Engineering (Physical Sciences)
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