About this document
XPS Techniques for Thin Film Analysis by Ali Hussnain is a document available to read on EtoBox.
The document discusses applications of X-ray photoelectron spectroscopy (XPS) in analyzing thin films. XPS can be used to determine 1) the composition and chemical state of thin films by analyzing peaks in survey and narrow scan spectra, 2) depth profiles within thin films using either non-destructive angle-resolved measurements or destructive depth profiling techniques, and 3) thin film thickness through measurements of elemental intensities at different take-off angles.
- Author
- Ali Hussnain
- Language
- EN