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About this Engineering article
Characterization of interface structure in GaInAs/InP superlattices by means of X-ray diffraction by R. Meyer; M. Hollfelder; H. Hardtdegen; B. Lengeler; H. Lüth is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- R. Meyer; M. Hollfelder; H. Hardtdegen; B. Lengeler; H. Lüth
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0022-0248)
- Published
- 1992
- Language
- EN
- Field
- Engineering (Physical Sciences)
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