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About this Engineering article
In situ synchrotron X-ray microdiffraction study of deformation behavior in polycrystalline coppers during uniaxial deformations by H.D. Joo; J.S. Kim; K.H. Kim; N. Tamura; Y.M. Koo is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- H.D. Joo; J.S. Kim; K.H. Kim; N. Tamura; Y.M. Koo
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 1359-6462)
- Published
- 2004
- Language
- EN
- Field
- Engineering (Physical Sciences)
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