About this scholarly article

Proceedings of International Solid State Sensors and Actuators Conference (Transducers '97) - Wafer-scale processing, assembly, and testing of tunneling infrared detectors by Grade, J.; Barzilai, A.; Reynolds, J.K.; Cheng-Hsien Liu, ; Partridge, A.; Jerman, H.; Kenny, T. is a scholarly article available to read on EtoBox.

Author

Grade, J.; Barzilai, A.; Reynolds, J.K.; Cheng-Hsien Liu, ; Partridge, A.; Jerman, H.; Kenny, T.

Publisher

IEEE

Published

1997

Language

EN