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About this Engineering article
Generalized stacking fault energies for embedded atom FCC metals by Zimmerman, Jonathan A; Gao, Huajian; Abraham, Farid F is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Zimmerman, Jonathan A; Gao, Huajian; Abraham, Farid F
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0965-0393)
- Published
- 2000
- Field
- Engineering (Physical Sciences)
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