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About this Materials Science article
Fractal Characterization of the Silicon Surfaces Produced by Ion Beam Irradiation of Varying Fluences by Yadav, R.P.; Kumar, T.; Mittal, A.K.; Dwivedi, S.; Kanjilal, D. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Yadav, R.P.; Kumar, T.; Mittal, A.K.; Dwivedi, S.; Kanjilal, D.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0169-4332)
- Published
- 2015
- Field
- Materials Science (Physical Sciences)
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