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About this Engineering article
Investigation of localized versus uniform strain as a performance booster in InAs Tunnel-FETs by Conzatti, F.; Pala, M.G.; Esseni, D.; Bano, E. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Conzatti, F.; Pala, M.G.; Esseni, D.; Bano, E.
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0038-1101)
- Published
- 2013
- Language
- EN
- Field
- Engineering (Physical Sciences)
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