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About this Physics and Astronomy article
Fundamentals of epitaxial silicon film thickness measurements using emission and reflection Fourier transform infrared spectroscopy by Zhou, Zhen‐Hong ;Yang, Isabel ;Yu, Fuzhong ;Reif, Rafael is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Zhou, Zhen‐Hong ;Yang, Isabel ;Yu, Fuzhong ;Reif, Rafael
- Publisher
- American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
- Published
- 1993
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)
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