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About this Engineering article
A 90-nm CMOS 1.8-V 2-Gb NAND flash memory for mass storage applications by Lee, J.; Sung-Soo Lee; Oh-Suk Kwon; Kyeong-Han Lee; Dae-Seok Byeon; In-Young Kim; Kyoung-Hwa Lee; Young-Ho Lim; Byung-Soon Choi; Jong-Sik Lee; Wang-Chul Shin; Jeong-Hyuk Choi; Kang-Deog Suh is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Lee, J.; Sung-Soo Lee; Oh-Suk Kwon; Kyeong-Han Lee; Dae-Seok Byeon; In-Young Kim; Kyoung-Hwa Lee; Young-Ho Lim; Byung-Soon Choi; Jong-Sik Lee; Wang-Chul Shin; Jeong-Hyuk Choi; Kang-Deog Suh
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9200)
- Published
- 2003
- Field
- Engineering (Physical Sciences)