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About this Physics and Astronomy article

A TEM structural study of thermal stability of magnetic tunnel junctions integrated with CMOS devices by Lazarov, V K; Kohn, A; Uhrmann, T; Dimopoulos, T; Brückl, H; Achard, H; Baraduc, C; Vizzini, S; Oughaddou, H; Aufray, B; d'Avitaya, F A is a Physics and Astronomy article available to read on EtoBox.

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Author
Lazarov, V K; Kohn, A; Uhrmann, T; Dimopoulos, T; Brückl, H; Achard, H; Baraduc, C; Vizzini, S; Oughaddou, H; Aufray, B; d'Avitaya, F A
Publisher
Institute of Physics; IOP Publishing (ISSN 1742-6588)
Published
2008
Field
Physics and Astronomy (Physical Sciences)