About this scholarly article

Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - The application of scanning capacitance microscopy in device failure analysis [doping profile determination] by Lau, Y.M.; Lim, V.S.W.; Ang, L.B.; Trigg, A. is a scholarly article available to read on EtoBox.

Author

Lau, Y.M.; Lim, V.S.W.; Ang, L.B.; Trigg, A.

Publisher

IEEE

Published

2004

Language

EN