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About this Engineering article

Qualitative Prediction of Conduction Band Valley Profile in Silicon Thin Films from Bulk Properties by Density Functional k · p Perturbation Theory by Yamauchi, Jun is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Yamauchi, Jun
Publisher
American Scientific Publishers (ISSN 1546-1955)
Published
2009
Field
Engineering (Physical Sciences)