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About this Materials Science article
Local strain measurements during in situ TEM deformation with nanobeam electron diffraction by Minor, A.M.; Gammer, C.; Deng, Y.; Ophus, C.; Ercius, P.; Ciston, J. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Minor, A.M.; Gammer, C.; Deng, Y.; Ophus, C.; Ercius, P.; Ciston, J.
- Publisher
- Cambridge University Press; Cambridge University Press (CUP) (ISSN 1431-9276)
- Published
- 2016
- Field
- Materials Science (Physical Sciences)
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