About this scholarly article

SPIE Proceedings [SPIE Aerospace/Defense Sensing and Controls - Orlando, FL (Monday 13 April 1998)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III - Dichroic beam combiner to support hardware-in-the-loop testing of dual-mode common aperture seekers by Mobley, Scott B.; Cole, Jr., John S.; Murrer, Jr., Robert Lee is a scholarly article available to read on EtoBox.

Author

Mobley, Scott B.; Cole, Jr., John S.; Murrer, Jr., Robert Lee

Publisher

SPIE

Published

1998

Language

EN