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Spectroscopic ellipsometry study of CuCdTeO thin films grown by reactive co-sputtering by A. Mendoza-Galván; S. Jiménez-Sandoval; J. Carmona-Rodríguez is a Engineering article available to read on EtoBox.

What is Spectroscopic ellipsometry study of CuCdTeO thin films grown by reactive co-sputtering about?

The complex dielectric function of CdTeO x and CuCdTeO thin films was determined by spectroscopic ellipsometry in the photon energy range of 1.5 to 5 eV. The films were grown onto glass slides substrates by reactive rf co-sputtering using CdTe and Cu targets in an Ar + O 2 atmosphere. Films with different Cu concentrations were obtained by varying the power on the Cu target. The dielectric function of the films is represented by a generalized Lorentz harmonic oscillator expression. Three-dimensional type line-shapes for the critical points E 1 and E 1 + Δ 1 of CdTe were identified in CdTeO x and CuCdTeO films even for Cu and O concentrations above 20 at.%. This latter result can be indicative of CdTe alloying with those elements widening the possibilities for new photovoltaic materials.

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Author

A. Mendoza-Galván; S. Jiménez-Sandoval; J. Carmona-Rodríguez

Publisher

Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)

Published

2011

Language

EN

Field

Engineering (Physical Sciences)