About this scholarly article

2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM) - Reason analysis and countermeasure of opening failure of 220 kV circuit breaker by Wang, Wei; Yan, Lin; Zhang, Na; Yu, Hua; Tao, Wen-biao is a scholarly article available to read on EtoBox.

Author

Wang, Wei; Yan, Lin; Zhang, Na; Yu, Hua; Tao, Wen-biao

Publisher

IEEE

Published

2017

Language

EN