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This document discusses the significance of Electric Overstress (EOS) exposure to magnetic heads in automated manufacturing, emphasizing its increasing importance as sensitivity rises. It explores various sources of EOS, including voltage-source EOS and EMI-induced EOS, and highlights the implications of these exposures on the yield management and maintenance of sensitive components. The paper provides detailed examples of how EOS can occur in production environments, particularly through tools that are pre

Author

Carlos Alberto de Almeida

Language

EN