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About this Materials Science article
Characterization of Neon Implantation Damage in Silicon by E. Oliviero; S. Peripolli; P.F.P. Fichtner; L. Amaral is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- E. Oliviero; S. Peripolli; P.F.P. Fichtner; L. Amaral
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd; Elsevier BV (ISSN 0921-5107)
- Published
- 2004
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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