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About this Engineering article
Multiquantity intelligent measurement system for investigating thermal properties of semiconductor devices: K. Kowalski, H. Chacinski, A.J. Wieckowski (Inst. of Radioelectron., Techn. Univ. of Warsaw, Poland) 5th International IMEKO symposium on Intelligent Measurement, Jena, Germany, 10–14 June 1986 (Budapest, Hungary: IMEKO 1986) vol. 2, pp 231-3 is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd; Elsevier BV (ISSN 0026-2692)
- Published
- 1987
- Field
- Engineering (Physical Sciences)