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Annual Reliability and Maintainability Symposium. 2001 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.01CH37179) - Software failure modes and effects analysis for a small embedded control system by Bowles, J.B.; Wan, C. is a scholarly article available to read on EtoBox.

Author
Bowles, J.B.; Wan, C.
Publisher
IEEE
Published
2001
Language
EN

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