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About this scholarly article
2010 27th International Conference on Microelectronics Proceedings - Modeling of main leakage currents and their contribution to channel current in Fin-FETs by Garduno, I.; Cerdeira, A.; Estrada, M.; Kilchytska, V.; Flandre, D. is a scholarly article available to read on EtoBox.
- Author
- Garduno, I.; Cerdeira, A.; Estrada, M.; Kilchytska, V.; Flandre, D.
- Publisher
- IEEE
- Published
- 2010
- Language
- EN
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