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About this Engineering article
Microstructural characteristics of AlN thin layers grown on Si(110) substrates by molecular beam epitaxy: Transmission electron microscopy study by Kim, Y.H.; Lee, J.H.; Noh, Y.K.; Oh, J.E.; Ahn, S.J. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kim, Y.H.; Lee, J.H.; Noh, Y.K.; Oh, J.E.; Ahn, S.J.
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 2015
- Language
- EN
- Field
- Engineering (Physical Sciences)
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