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About this Materials Science article
Electrical characteristics of oxygen precipitation related defects in Czochralski silicon wafers by F.G. Kirscht; Y. Furukawa; W. Seifert; K. Schmalz; A. Buczkowski; S.B. Kim; H. Abe; H. Koya; J. Bailey is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- F.G. Kirscht; Y. Furukawa; W. Seifert; K. Schmalz; A. Buczkowski; S.B. Kim; H. Abe; H. Koya; J. Bailey
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd; Elsevier BV (ISSN 0921-5107)
- Published
- 1996
- Language
- EN
- Field
- Materials Science (Physical Sciences)