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Can I read Fault Analysis in Cryptography (Information Security and Cryptography) on EtoBox?

Fault Analysis in Cryptography (Information Security and Cryptography) by Elisabeth Oswald, François-Xavier Standaert (auth.), Marc Joye, Michael Tunstall (eds.) is a nonfiction available to read on EtoBox.

What is Fault Analysis in Cryptography (Information Security and Cryptography) about?

In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospace industry, led to methods of hardening electronic devices designed for harsh environments. Ultimately various mechanisms for fault creation and propagation were discovered, and in particular it was noted that many cryptographic algorithms succumb to so-called fault attacks. Preventing fault attacks without sacrificing performance is nontrivial and this is the subject of this book. Part I deals with side-channel analysis and its relevance to fault attacks. The chapters in Part II cover fault analysis in secret key cryptography, with chapters on block ciphers, fault analysis of DES and AES, countermeasures for symmetric-key ciphers, and countermeasures against attacks on AES. Part III deals with fault analysis in public key cryptography, with chapters dedicated to classical RSA and RSA-CRT implementations, elliptic curve cryptosystems and countermeasures using fault detection, devices resilient to

Who reads Fault Analysis in Cryptography (Information Security and Cryptography)?

It is typically read by self-directed learners exploring a subject in depth.

Common subject areas: history, science, philosophy, social sciences.

Author
Elisabeth Oswald, François-Xavier Standaert (auth.), Marc Joye, Michael Tunstall (eds.)
Publisher
Springer-Verlag Berlin Heidelberg
Published
2012
Language
EN
ISBN
9781283627221
Category
nonfiction
Subjects
Management, Engineering, Science

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