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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - One-shot 3D shape and color measurement using composite RGB fringe projection and optimum three-frequency selection by Zhang, Zonghua; Ye, Shenghua; Zhang, Guangjun; Zhang, Sixiang; Ni, Jun is a scholarly article available to read on EtoBox.

Author
Zhang, Zonghua; Ye, Shenghua; Zhang, Guangjun; Zhang, Sixiang; Ni, Jun
Publisher
SPIE
Published
2009
Language
EN

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