About this scholarly article

ISAPE2012 - A study on EMC stress-strength interference model and EMC reliability by Wu, Jian; Xie, Shuguo; Ke, Tenglong; Chen, Xi; Li, Can is a scholarly article available to read on EtoBox.

Author

Wu, Jian; Xie, Shuguo; Ke, Tenglong; Chen, Xi; Li, Can

Publisher

IEEE

Published

2012

Language

EN