About this scholarly article

X-ray Moiré Patterns of Silicon Crystals with Distortions Caused by Local Concentrated Forces by Fodchuk, Igor M.; Fesiv, Igor V.; Novikov, Sergiy M.; Struk, Yaroslav M.; Angelsky, Oleg V. is a scholarly article available to read on EtoBox.

Author

Fodchuk, Igor M.; Fesiv, Igor V.; Novikov, Sergiy M.; Struk, Yaroslav M.; Angelsky, Oleg V.

Publisher

SPIE

Published

2011