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About this Engineering article
Review of Reference Metrology for Nanotechnology: Significance, Challenges, and Solutions by Ukraintsev, Vladimir is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Ukraintsev, Vladimir
- Publisher
- The International Society for Optical Engineering; SPIE - International Society for Optical Engineering; S P I E - International Society for Optical Engineering; SPIE-Intl Soc Optical Eng (ISSN 1932-5150)
- Published
- 2012
- Language
- EN
- Field
- Engineering (Physical Sciences)