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About this Engineering article
Thermoreflectance mapping observation of Power MOSFET under UIS avalanche breakdown condition by Endo, Koichi; Norimatsu, Kenji; Nakamura, Tomonori; Setoya, Takashi; Nakamae, Koji is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Endo, Koichi; Norimatsu, Kenji; Nakamura, Tomonori; Setoya, Takashi; Nakamae, Koji
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 2015
- Language
- EN
- Field
- Engineering (Physical Sciences)