About this scholarly article

Proceedings of International Conference on Microelectronic Test Structures - A test chip for the development of PIN-type silicon radiation detectors by Dalla Betta, G.F.; Boscardin, M.; Verzellesi, G.; Pignatel, G.U.; Fazzi, A.; Soncini, G. is a scholarly article available to read on EtoBox.

Author

Dalla Betta, G.F.; Boscardin, M.; Verzellesi, G.; Pignatel, G.U.; Fazzi, A.; Soncini, G.

Publisher

IEEE

Published

1996

Language

EN