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About this Engineering article
Compact Modeling of Drain Current Thermal Noise in FDSOI MOSFETs Including Back-Bias Effect by Sahu, Yogendra; Kushwaha, Pragya; Dasgupta, Avirup; Hu, Chenming; Chauhan, Yogesh Singh is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Sahu, Yogendra; Kushwaha, Pragya; Dasgupta, Avirup; Hu, Chenming; Chauhan, Yogesh Singh
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9480)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)