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About this Engineering article
A finite weakest-link model of lifetime distribution of high-k gate dielectrics under unipolar AC voltage stress by Jia-Liang Le is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Jia-Liang Le
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 2012
- Language
- EN
- Field
- Engineering (Physical Sciences)