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About this Engineering article
Effects of System Parameters on Tip-wear in Tapping Mode Atomic Force Microscopy by Huang, Yen-Pu; Lin, Shih-Chieh; Lin, Victor Tzeng-Yow is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Huang, Yen-Pu; Lin, Shih-Chieh; Lin, Victor Tzeng-Yow
- Publisher
- IOP Publishing; IOP Publishing Ltd. (ISSN 2051-672X)
- Published
- 2013
- Language
- EN
- Field
- Engineering (Physical Sciences)
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