About this Engineering article
Verification of Single-Pulse Avalanche Failure Mechanism for Double-Trench SiC Power MOSFETs by Wei, Jiaxing; Liu, Siyang; Zhao, Hangbo; Fu, Hao; Zhang, Xiaobing; Li, Shiyan; Sun, Weifeng is a Engineering article available to read on EtoBox.
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- Author
- Wei, Jiaxing; Liu, Siyang; Zhao, Hangbo; Fu, Hao; Zhang, Xiaobing; Li, Shiyan; Sun, Weifeng
- Publisher
- Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers Inc.; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 2168-6777)
- Published
- 2020
- Language
- EN
- Field
- Engineering (Physical Sciences)