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An Efficient Control Variates Method for Yield Estimation of Analog Circuits Based on a Local Model by Pierre-Francois Desrumaux; Yoan Dupret; Jens Tingleff; Sean Minehane; Mark Redford; Laurent Latorre; Pascal Nouet is a scholarly article available to read on EtoBox.

What is An Efficient Control Variates Method for Yield Estimation of Analog Circuits Based on a Local Model about?

Statistical analysis of analog circuits usually relies on the standard Monte Carlo method to estimate the yield of a circuit. However, this method is limited by a slow convergence rate which leads to a prohibitive number of simulations to reach a given accuracy. In this paper, we propose to combine the kernelbased distribution estimator with the control variates method in order to obtain an accurate yield estimation with only a few hundred simulations. With respect to the auxiliary variable needed for the control variates method, we propose a quick modeling technique based on local sensitivities.

Author

Pierre-Francois Desrumaux; Yoan Dupret; Jens Tingleff; Sean Minehane; Mark Redford; Laurent Latorre; Pascal Nouet

Publisher

ACM

Published

2012

Language

EN