About this scholarly article

SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Cargo Inspection Technologies - X-ray cargo inspection by Ries, Hermann; Hemp, Fred; Koch, Cornelius; Lawrence, Andre H. is a scholarly article available to read on EtoBox.

Author

Ries, Hermann; Hemp, Fred; Koch, Cornelius; Lawrence, Andre H.

Publisher

SPIE

Published

1994

Language

EN