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About this scholarly article
2013 IEEE International Reliability Physics Symposium (IRPS) - Investigation of data retention window closure on logic embedded non-volatile memory by Liao, Y. Y.; Tsai, L. Y.; Leu, L. Y.; Lee, Y.-H; Wang, W.; Wu, K. is a scholarly article available to read on EtoBox.
- Author
- Liao, Y. Y.; Tsai, L. Y.; Leu, L. Y.; Lee, Y.-H; Wang, W.; Wu, K.
- Publisher
- IEEE
- Published
- 2013
- Language
- EN
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