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About this Engineering article
Delay Test Generation: A Hardware Perspective by Jacob Savir is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Jacob Savir
- Publisher
- Springer US; Springer-Verlag; Kluwer Academic Publishers; Springer Science and Business Media LLC (ISSN 0923-8174)
- Published
- 1997
- Field
- Engineering (Physical Sciences)