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Mechanism for Improvement of N-channel Metal-oxide-semiconductor Transistors by Tensile Stress by Yang, Peizhen; Lau, W. S.; Lai, Seow Wei; Lo, V. L.; Toh, L. F.; Wang, Jacob; Siah, S. Y.; Chan, L. is a Physics and Astronomy article available to read on EtoBox.

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Author
Yang, Peizhen; Lau, W. S.; Lai, Seow Wei; Lo, V. L.; Toh, L. F.; Wang, Jacob; Siah, S. Y.; Chan, L.
Publisher
American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
Published
2010
Language
EN
Field
Physics and Astronomy (Physical Sciences)

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