Opening book details…
About this Materials Science article
Data retention and low voltage operation of Al2O3/Hf0.5Zr0.5O2 based ferroelectric tunnel junctions by Shekhawat, Aniruddh; Walters, Glen; Yang, Ning; Guo, Jing; Nishida, Toshikazu; Moghaddam, Saeed is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Shekhawat, Aniruddh; Walters, Glen; Yang, Ning; Guo, Jing; Nishida, Toshikazu; Moghaddam, Saeed
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0957-4484)
- Published
- 2020
- Field
- Materials Science (Physical Sciences)