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About this Engineering article
Direct-current Measurements of Oxide and Interface Traps on Oxidized Silicon by Neugroschel, A.; Chih-Tang Sah; Han, K.M.; Carroll, M.S.; Nishida, T.; Kavalieros, J.T.; Yi Lu is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Neugroschel, A.; Chih-Tang Sah; Han, K.M.; Carroll, M.S.; Nishida, T.; Kavalieros, J.T.; Yi Lu
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 1995
- Language
- EN
- Field
- Engineering (Physical Sciences)