About this Engineering article
Deposition of PZT films by MOCVD at low temperature and their change in properties with annealing temperature and Zr/Ti ratio by Young-Min Kim; Won-Jae Lee; Ho-Gi Kim is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Young-Min Kim; Won-Jae Lee; Ho-Gi Kim
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 1996
- Language
- EN
- Field
- Engineering (Physical Sciences)